scanning nonlinear dielectric microscopy

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Scanning Nonlinear Dielectric Microscopy
Author : Yasuo Cho
Publisher : Woodhead Publishing
Release Date : 2020-05-20
ISBN 10 : 0081028032
Pages : 256 pages
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Nanoscale Characterisation of Ferroelectric Materials
Author : Marin Alexe,Alexei Gruverman
Publisher : Springer Science & Business Media
Release Date : 2013-03-09
ISBN 10 : 3662089017
Pages : 282 pages
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This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

Roadmap of Scanning Probe Microscopy
Author : Seizo Morita
Publisher : Springer Science & Business Media
Release Date : 2006-12-30
ISBN 10 : 3540343156
Pages : 201 pages
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Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Author : Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
Publisher : Springer Science & Business Media
Release Date : 2006-03-30
ISBN 10 : 1402030193
Pages : 488 pages
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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Applied Scanning Probe Methods X
Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
Release Date : 2007-12-20
ISBN 10 : 3540740856
Pages : 427 pages
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Ferroelectric Random Access Memories
Author : Hiroshi Ishiwara,Masanori Okuyama,Yoshihiro Arimoto
Publisher : Springer Science & Business Media
Release Date : 2004-04-16
ISBN 10 : 9783540407188
Pages : 290 pages
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The book consists of 5 parts: (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects; each part is further divided into several chapters. Because of the wide range of topics discussed, each chapter in this book was written by one of the best authors knowing the specific topic very well.

Polar Oxides
Author : Rainer Waser,Ulrich Böttger,Stephan Tiedke
Publisher : John Wiley & Sons
Release Date : 2006-03-06
ISBN 10 : 3527604898
Pages : 391 pages
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Here, more than 20 experts from leading research institutes around the world present the entire scope of this rapidly developing field. In so doing, they cover a wide range of topics, including the characterization and investigation of structural, dielectric and piezoelectric properties of ceramic materials, a well as phase transitions, electrical and optical properties and microscopic investigations. Another feature is a complete profile of the properties of polar oxides -- from their proof to their latest applications. Throughout, the authors review, discuss and assess the material properties with regard to new and advanced characterization and imaging techniques. For physicists, physicochemists, semiconductor and solid state physicists, materials scientists, and students of chemistry and physics.

JJAP
Author : N.A
Publisher : N.A
Release Date : 2001
ISBN 10 :
Pages : 329 pages
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Japanese Journal of Applied Physics
Author : N.A
Publisher : N.A
Release Date : 2007
ISBN 10 :
Pages : 329 pages
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Domains in Ferroic Crystals and Thin Films
Author : Alexander Tagantsev,L. Eric Cross,Jan Fousek
Publisher : Springer Science & Business Media
Release Date : 2011-03-02
ISBN 10 : 1441914226
Pages : 822 pages
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At present, the marketplace for professionals, researchers, and graduate students in solid-state physics and materials science lacks a book that presents a comprehensive discussion of ferroelectrics and related materials in a form that is suitable for experimentalists and engineers. This book proposes to present a wide coverage of domain-related issues concerning these materials. This coverage includes selected theoretical topics (which are covered in the existing literature) in addition to a plethora of experimental data which occupies over half of the book. The book presents experimental findings and theoretical understanding of ferroic (non-magnetic) domains developed during the past 60 years. It addresses the situation by looking specifically at bulk crystals and thin films, with a particular focus on recently-developed microelectronic applications and methods for observations of domains with techniques such as scanning force microscopy, polarized light microscopy, scanning optical microscopy, electron microscopy, and surface decorating techniques. "Domains in Ferroic Crystals and Thin Films" covers a large area of material properties and effects connected with static and dynamic properties of domains, which are extremely relevant to materials referred to as ferroics. In other textbooks on solid state physics, one large group of ferroics is customarily covered: those in which magnetic properties play a dominant role. Numerous books are specifically devoted to magnetic ferroics and cover a wide spectrum of magnetic domain phenomena. In contrast, "Domains in Ferroic Crystals and Thin Films" concentrates on domain-related phenomena in nonmagnetic ferroics. These materials are still inadequately represented in solid state physics textbooks and monographs.

Ferroelectric Thin Films
Author : Masanori Okuyama
Publisher : Springer Science & Business Media
Release Date : 2005-02-22
ISBN 10 : 9783540241638
Pages : 244 pages
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Ferroelectric thin films continue to attract much attention due to their developing applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties of these materials and the associated device physics. The contributing authors are acknowledged experts in the field.

Proceedings of the ... IEEE Conference on Nanotechnology
Author : N.A
Publisher : N.A
Release Date : 2002
ISBN 10 :
Pages : 329 pages
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Ferroelectric Thin Films IX
Author : Paul Cameron McIntyre
Publisher : N.A
Release Date : 2001
ISBN 10 :
Pages : 517 pages
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Ferroelectric Thin Films
Author : N.A
Publisher : N.A
Release Date : 2005
ISBN 10 :
Pages : 329 pages
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Advanced Data Storage Materials and Characterization Techniques: Volume 803
Author : Andrei Mijiritskii
Publisher : N.A
Release Date : 2004-04-28
ISBN 10 :
Pages : 280 pages
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Emerging Nanoelectronic Devices
Author : An Chen,James Hutchby,Victor Zhirnov,George Bourianoff
Publisher : John Wiley & Sons
Release Date : 2014-11-26
ISBN 10 : 1118958276
Pages : 576 pages
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Emerging Nanoelectronic Devices focuses on the future direction of semiconductor and emerging nanoscale device technology. As the dimensional scaling of CMOS approaches its limits, alternate information processing devices and microarchitectures are being explored to sustain increasing functionality at decreasing cost into the indefinite future. This is driving new paradigms of information processing enabled by innovative new devices, circuits, and architectures, necessary to support an increasingly interconnected world through a rapidly evolving internet. This original title provides a fresh perspective on emerging research devices in 26 up to date chapters written by the leading researchers in their respective areas. It supplements and extends the work performed by the Emerging Research Devices working group of the International Technology Roadmap for Semiconductors (ITRS). Key features: • Serves as an authoritative tutorial on innovative devices and architectures that populate the dynamic world of “Beyond CMOS” technologies. • Provides a realistic assessment of the strengths, weaknesses and key unknowns associated with each technology. • Suggests guidelines for the directions of future development of each technology. • Emphasizes physical concepts over mathematical development. • Provides an essential resource for students, researchers and practicing engineers.

Ferroelectric Thin Films X:
Author : Stephen R. Gilbert
Publisher : Materials Research Society
Release Date : 2002-05-01
ISBN 10 :
Pages : 424 pages
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Nanoscale Phenomena in Ferroelectric Thin Films
Author : Seungbum Hong
Publisher : Springer Science & Business Media
Release Date : 2004-01-31
ISBN 10 : 9781402076305
Pages : 288 pages
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This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.

Dekker Encyclopedia of Nanoscience and Nanotechnology
Author : James A. Schwarz,Cristian I. Contescu,Karol Putyera
Publisher : CRC Press
Release Date : 2004
ISBN 10 : 9780824750503
Pages : 4014 pages
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Digest of Technical Papers
Author : N.A
Publisher : N.A
Release Date : 2005
ISBN 10 :
Pages : 329 pages
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